Additional file 2 of Genome-wide association mapping and genomic prediction analyses reveal the genetic architecture of grain yield and agronomic traits under drought and optimum conditions in maize

Supplementary Material 2: Supplementary Figure S2. Farm CPU-based Manhattan and Q-Q plots of genome-wide association study (GWAS) on eight traits evaluated under optimum (_OPT) and drought (_DS) environmental conditions. The − log10(p) values on the Y-axis in the Manhattan plot represent grain yield (GY), Days to 50 % anthesis, (AD), Days to 50 % silking (SD), Anthesis-Silking Interval (ASI), Plant height (PH), Ear height (EH), Ear position (EPO) and Ear per plant (EPP) plotted against chromosome position on X-axis. The red and blue solid horizontal lines in the Manhattan plots represent the genome-wide (− log10 (p) =6.2). The quantile—quantile plots represent observed against the expected −log10 (p).