Characterisation of Organic Semiconductor Growth using Real-time Electron Spectroscopy

D. Andrew Evans, Owain R. Roberts, Gruffudd T. Williams, David. P. Langstaff

Allbwn ymchwil: Pennod mewn Llyfr/Adroddiad/Trafodion CynhadleddTrafodion Cynhadledd (Nid-Cyfnodolyn fathau)


An organic molecular beam deposition system coupled to a soft x-ray excitation source has been developed to monitor the growth of organic semiconductor thin films in-situ and in real-time. Rapid collection of photoelectron spectra has been enabled using a multichannel array detector coupled to a hemispherical analyzer. The organic semiconductor tin phthalocyanine (SnPc) exhibits a Stranski-Krastanov growth mode on a polycrystalline gold substrate where the transition thickness between layered and clustered growth has been determined to be comparable to the thickness of a single molecular layer within which the molecules are standing on edge relative to the substrate plane.
Iaith wreiddiolSaesneg
TeitlMRS Proceedings
Tudalennau mrsf10-1318-uu09-05
Dynodwyr Gwrthrych Digidol (DOIs)
StatwsCyhoeddwyd - 01 Ion 2011

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