Detector array system on a single silicon chip - uniformity correction

Keith Birkinshaw*, Dinesh J. Narayan, David P. Langstaff, G. Neville Greaves

*Awdur cyfatebol y gwaith hwn

Allbwn ymchwil: Pennod mewn Llyfr/Adroddiad/Trafodion CynhadleddTrafodion Cynhadledd (Nid-Cyfnodolyn fathau)

2 Dyfyniadau (Scopus)

Crynodeb

An account is given on the work done using a detector array integrated on a single silicon chip. Focus is on array uniformity and the accurate measure of incident intensities. Two approaches to correction are also presented: spectra built up by measurement of single events can yield accurate peak intensities and positions; and where spectra are measured in the normal way by summing many events before readout, a correction for non-uniformity is desirable.

Iaith wreiddiolSaesneg
TeitlProceedings of the 1999 Detectors for Crystallography and Diffraction Studies at Synchrotron Sources
Tudalennau58-65
Nifer y tudalennau8
Cyfrol3774
StatwsCyhoeddwyd - 1999
DigwyddiadProceedings of the 1999 Detectors for Crystallography and Diffraction Studies at Synchrotron Sources - Denver, CO, USA
Hyd: 19 Gorff 199919 Gorff 1999

Cyfres gyhoeddiadau

EnwProceedings of SPIE - The International Society for Optical Engineering
CyhoeddwrSPIE
ISSN (Argraffiad)0277-786X

Cynhadledd

CynhadleddProceedings of the 1999 Detectors for Crystallography and Diffraction Studies at Synchrotron Sources
DinasDenver, CO, USA
Cyfnod19 Gorff 199919 Gorff 1999

Ôl bys

Gweld gwybodaeth am bynciau ymchwil 'Detector array system on a single silicon chip - uniformity correction'. Gyda’i gilydd, maen nhw’n ffurfio ôl bys unigryw.

Dyfynnu hyn