Non-destructive, high-content analysis of wheat grain traits using X-ray micro computed tomography

Aoife Hughes, Karen Louise Askew, Callum Paul Scotson, Kevin Stewart Williams, Colin Sauze, Fiona Corke, John Doonan, Candida Nibau

University of Southampton

Allbwn ymchwil: Cyfraniad at gyfnodolyn › Erthygl › adolygiad gan gymheiriaid

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222 Wedi eu Llwytho i Lawr (Pure)

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Analysis of wheat grain traits using X-ray micro computed tomography
Hughes, A., Nibau, C., Doonan, J., Corke, F., Williams, K. S. & Sauze, C., Prifysgol Aberystwyth | Aberystwyth University, 16 Awst 2017
Dangosydd eitem ddigidol (DOI): 10.20391/a11df174-d73d-4443-a7fd-ab5b7039df79, https://github.com/NPPC-UK/microCT_grain_analyser
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