Spectroscopic Ellipsometry and Optical Modelling of Structurally Colored Opaline Thin-Films

Chris E. Finlayson*, Giselle Rosetta, John J. Tomes

*Awdur cyfatebol y gwaith hwn

Allbwn ymchwil: Cyfraniad at gyfnodolynErthygladolygiad gan gymheiriaid

5 Dyfyniadau (Scopus)
72 Wedi eu Llwytho i Lawr (Pure)

Crynodeb

The method of spectroscopic ellipsometry is applied to complex periodic nanomaterials, consisting of shear-ordered polymeric nanosphere composites, with intense resonant structural color. A corresponding multilayer optical quasi-model of the system, parametrizing the inherent degree of sample disorder and encompassing key properties of effective refractive-index and index-contrast, is developed to elucidate the correlation between the ∆ and Ψ ellipsometric parameters and the shear-induced opaline crystallinity. These approaches offer reliable means of in-line tracking of the sample quality of such “polymer opals” in large scale processing and applications.
Iaith wreiddiolSaesneg
Rhif yr erthygl4888
Nifer y tudalennau9
CyfnodolynApplied Sciences
Cyfrol12
Rhif cyhoeddi10
Dynodwyr Gwrthrych Digidol (DOIs)
StatwsCyhoeddwyd - 12 Mai 2022

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