Spectroscopic Ellipsometry and Optical Modelling of Structurally Colored Opaline Thin-Films

Chris E. Finlayson; Giselle Rosetta; John J. Tomes

doi:10.3390/app12104888

Spectroscopic Ellipsometry and Optical Modelling of Structurally Colored Opaline Thin-Films

Chris E. Finlayson^*, Giselle Rosetta, John J. Tomes

^*Awdur cyfatebol y gwaith hwn

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Allbwn ymchwil: Cyfraniad at gyfnodolyn › Erthygl › adolygiad gan gymheiriaid

5 Dyfyniadau (Scopus)

73 Wedi eu Llwytho i Lawr (Pure)

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The method of spectroscopic ellipsometry is applied to complex periodic nanomaterials, consisting of shear-ordered polymeric nanosphere composites, with intense resonant structural color. A corresponding multilayer optical quasi-model of the system, parametrizing the inherent degree of sample disorder and encompassing key properties of effective refractive-index and index-contrast, is developed to elucidate the correlation between the ∆ and Ψ ellipsometric parameters and the shear-induced opaline crystallinity. These approaches offer reliable means of in-line tracking of the sample quality of such “polymer opals” in large scale processing and applications.

Iaith wreiddiol	Saesneg
Rhif yr erthygl	4888
Nifer y tudalennau	9
Cyfnodolyn	Applied Sciences
Cyfrol	12
Rhif cyhoeddi	10
Dynodwyr Gwrthrych Digidol (DOIs)	https://doi.org/10.3390/app12104888
Statws	Cyhoeddwyd - 12 Mai 2022

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10.3390/app12104888Trwydded: CC BY

ArticleFersiwn derfynol wedi’i chyhoeddi, 1.58 MBTrwydded: CC BY

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Data to support "Spectroscopic Ellipsometry and Optical Modelling of Structurally Colored Opaline Thin-Films"
Finlayson, C., Rosetta, G. & Tomes, J., Prifysgol Aberystwyth | Aberystwyth University, 17 Mai 2022
Dangosydd eitem ddigidol (DOI): 10.20391/e20c9d21-9264-45c3-aee2-98711d02ac6d
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1 Wedi Gorffen

SPARC II - Solar Photovoltaic Academic Research
Evans, A. (Prif Ymchwilydd)
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01 Ion 2016 → 31 Maw 2023
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@article{6bb2d24adc1846d8925bdf58ef9d3817,

title = "Spectroscopic Ellipsometry and Optical Modelling of Structurally Colored Opaline Thin-Films",

abstract = "The method of spectroscopic ellipsometry is applied to complex periodic nanomaterials, consisting of shear-ordered polymeric nanosphere composites, with intense resonant structural color. A corresponding multilayer optical quasi-model of the system, parametrizing the inherent degree of sample disorder and encompassing key properties of effective refractive-index and index-contrast, is developed to elucidate the correlation between the ∆ and Ψ ellipsometric parameters and the shear-induced opaline crystallinity. These approaches offer reliable means of in-line tracking of the sample quality of such “polymer opals” in large scale processing and applications.",

keywords = "ellipsometry, structural color, opal, polymers, optical modelling",

author = "Finlayson, {Chris E.} and Giselle Rosetta and Tomes, {John J.}",

note = "Funding Information: Funding: This research was funded in part by Llywodraeth Cymru KESS-2 (European Social Fund), SPARC-II (European Regional Development Fund). Publisher Copyright: {\textcopyright} 2022 by the authors. Licensee MDPI, Basel, Switzerland.",

year = "2022",

month = may,

day = "12",

doi = "10.3390/app12104888",

language = "English",

volume = "12",

journal = "Applied Sciences",

publisher = "Multidisciplinary Digital Publishing Institute",

number = "10",

}

TY - JOUR

T1 - Spectroscopic Ellipsometry and Optical Modelling of Structurally Colored Opaline Thin-Films

AU - Finlayson, Chris E.

AU - Rosetta, Giselle

AU - Tomes, John J.

N1 - Funding Information: Funding: This research was funded in part by Llywodraeth Cymru KESS-2 (European Social Fund), SPARC-II (European Regional Development Fund). Publisher Copyright: © 2022 by the authors. Licensee MDPI, Basel, Switzerland.

PY - 2022/5/12

Y1 - 2022/5/12

N2 - The method of spectroscopic ellipsometry is applied to complex periodic nanomaterials, consisting of shear-ordered polymeric nanosphere composites, with intense resonant structural color. A corresponding multilayer optical quasi-model of the system, parametrizing the inherent degree of sample disorder and encompassing key properties of effective refractive-index and index-contrast, is developed to elucidate the correlation between the ∆ and Ψ ellipsometric parameters and the shear-induced opaline crystallinity. These approaches offer reliable means of in-line tracking of the sample quality of such “polymer opals” in large scale processing and applications.

AB - The method of spectroscopic ellipsometry is applied to complex periodic nanomaterials, consisting of shear-ordered polymeric nanosphere composites, with intense resonant structural color. A corresponding multilayer optical quasi-model of the system, parametrizing the inherent degree of sample disorder and encompassing key properties of effective refractive-index and index-contrast, is developed to elucidate the correlation between the ∆ and Ψ ellipsometric parameters and the shear-induced opaline crystallinity. These approaches offer reliable means of in-line tracking of the sample quality of such “polymer opals” in large scale processing and applications.

KW - ellipsometry

KW - structural color

KW - opal

KW - polymers

KW - optical modelling

UR - http://www.scopus.com/inward/record.url?scp=85130541525&partnerID=8YFLogxK

U2 - 10.3390/app12104888

DO - 10.3390/app12104888

M3 - Article

VL - 12

JO - Applied Sciences

JF - Applied Sciences

IS - 10

M1 - 4888

ER -

Spectroscopic Ellipsometry and Optical Modelling of Structurally Colored Opaline Thin-Films

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Data to support "Spectroscopic Ellipsometry and Optical Modelling of Structurally Colored Opaline Thin-Films"

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SPARC II - Solar Photovoltaic Academic Research

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