@inproceedings{f96b746aef8c489aa9ae51bb45181b38,
title = "The enhanced light extraction top-emitting organic light-emitting diode based on metallic grating anode",
abstract = "The performance of optical light-coupling of Top-emitting organic light-emitting diode (OLED) is mainly suppressed by surface plasmon polaritons (SPP) on the interface between metal and organic layer, and micro-cavity effect between two metal electrodes. To reduce their influence and enhance the light extraction efficiency, an electromagnetic model of top-emitting organic light-emitting diode (TEOLED) with metallic grating anode is proposed in this report. The numerical simulation is implemented to research the performance of metallic grating anode that can enhances the light extraction efficiency of OLED by recovering the energy of surface plasmon polariton mode between organic-metal interface. The simulation based on the Finite Element method (FEM) and Finite difference time domain (FDTD) shows the field distribution and transmission spectrum of proposed TEOLED model, and then indicates the ability of metallic grating anode to improve the light extraction efficiency significantly, which provides a new approach to enhance the efficiency of top-emitting OLED.",
keywords = "Metallic grating anode, Organic light-emitting diodes, Surface plasmon polariton",
author = "Dun Qiao and Kang Li and Nigel Copner and Yongkang Gong and Guoji Chen",
note = "Publisher Copyright: {\textcopyright} 2019 IEEE.; 9th IEEE International Conference on Manipulation, Manufacturing and Measurement on the Nanoscale, 3M-NANO 2019 ; Conference date: 04-08-2019 Through 08-08-2019",
year = "2019",
month = aug,
doi = "10.1109/3M-NANO46308.2019.8947392",
language = "English",
series = "2019 IEEE International Conference on Manipulation, Manufacturing and Measurement on the Nanoscale, 3M-NANO 2019 - Proceedings",
publisher = "IEEE Press",
pages = "49--52",
editor = "Miao Yu and Zhankun Weng",
booktitle = "2019 IEEE International Conference on Manipulation, Manufacturing and Measurement on the Nanoscale, 3M-NANO 2019 - Proceedings",
address = "United States of America",
}