The enhanced light extraction top-emitting organic light-emitting diode based on metallic grating anode

Dun Qiao, Kang Li, Nigel Copner, Yongkang Gong, Guoji Chen

Allbwn ymchwil: Pennod mewn Llyfr/Adroddiad/Trafodion CynhadleddTrafodion Cynhadledd (Nid-Cyfnodolyn fathau)

3 Dyfyniadau(SciVal)

Crynodeb

The performance of optical light-coupling of Top-emitting organic light-emitting diode (OLED) is mainly suppressed by surface plasmon polaritons (SPP) on the interface between metal and organic layer, and micro-cavity effect between two metal electrodes. To reduce their influence and enhance the light extraction efficiency, an electromagnetic model of top-emitting organic light-emitting diode (TEOLED) with metallic grating anode is proposed in this report. The numerical simulation is implemented to research the performance of metallic grating anode that can enhances the light extraction efficiency of OLED by recovering the energy of surface plasmon polariton mode between organic-metal interface. The simulation based on the Finite Element method (FEM) and Finite difference time domain (FDTD) shows the field distribution and transmission spectrum of proposed TEOLED model, and then indicates the ability of metallic grating anode to improve the light extraction efficiency significantly, which provides a new approach to enhance the efficiency of top-emitting OLED.

Iaith wreiddiolSaesneg
Teitl2019 IEEE International Conference on Manipulation, Manufacturing and Measurement on the Nanoscale, 3M-NANO 2019 - Proceedings
GolygyddionMiao Yu, Zhankun Weng
CyhoeddwrIEEE Press
Tudalennau49-52
Nifer y tudalennau4
ISBN (Electronig)9781728102054
Dynodwyr Gwrthrych Digidol (DOIs)
StatwsCyhoeddwyd - Awst 2019
Cyhoeddwyd yn allanolIe
Digwyddiad9th IEEE International Conference on Manipulation, Manufacturing and Measurement on the Nanoscale, 3M-NANO 2019 - Zhenjiang, Tsieina
Hyd: 04 Awst 201908 Awst 2019

Cyfres gyhoeddiadau

Enw2019 IEEE International Conference on Manipulation, Manufacturing and Measurement on the Nanoscale, 3M-NANO 2019 - Proceedings

Cynhadledd

Cynhadledd9th IEEE International Conference on Manipulation, Manufacturing and Measurement on the Nanoscale, 3M-NANO 2019
Gwlad/TiriogaethTsieina
DinasZhenjiang
Cyfnod04 Awst 201908 Awst 2019

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