Data to support "Spectroscopic Ellipsometry and Optical Modelling of Structurally Colored Opaline Thin-Films"



The method of spectroscopic ellipsometry is applied to complex periodic nanomaterials, consisting of shear-ordered polymeric nanosphere composites, with intense resonant structural color. A corresponding multilayer optical quasi-model of the system, parametrizing the inherent degree of sample disorder and encompassing key properties of effective refractive-index and index-contrast, is developed to elucidate the correlation between the ∆ and Ψ ellipsometric parameters and the shear-induced opaline crystallinity. These approaches offer reliable means of in-line tracking of the sample quality of such “polymer opals” in large scale processing and applications.
Date made available17 May 2022
PublisherPrifysgol Aberystwyth | Aberystwyth University
Date of data production28 Jul 2021 - 11 May 2022

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