Equipments Details
Description
Cold field emission high resolution scanning electron microscope.
More powerful than a standard SEM, capable of 500,000 times magnification and resolution to two nanometres.
Incorporates a cathodoluminescence detector, backscatter electron detector, and energy dispersive x-ray spectrographic detector. Properties observed by these instruments may be correlated with features observed by the SEM, exploiting the side effects of the function of the SEM for more comprehensive readings.
This means that density and elemental makeup of the sample may be observed and plotted against the electron scan.
More powerful than a standard SEM, capable of 500,000 times magnification and resolution to two nanometres.
Incorporates a cathodoluminescence detector, backscatter electron detector, and energy dispersive x-ray spectrographic detector. Properties observed by these instruments may be correlated with features observed by the SEM, exploiting the side effects of the function of the SEM for more comprehensive readings.
This means that density and elemental makeup of the sample may be observed and plotted against the electron scan.
Details
| Name | Field Emission Scanning Electron Micrscope |
|---|---|
| Acquisition date | 01 Jun 2001 |
| Manufacturers | Hitachi |
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