Characterisation of Organic Semiconductor Growth using Real-time Electron Spectroscopy

D. Andrew Evans, Owain R. Roberts, Gruffudd T. Williams, David. P. Langstaff

Research output: Chapter in Book/Report/Conference proceedingConference Proceeding (Non-Journal item)


An organic molecular beam deposition system coupled to a soft x-ray excitation source has been developed to monitor the growth of organic semiconductor thin films in-situ and in real-time. Rapid collection of photoelectron spectra has been enabled using a multichannel array detector coupled to a hemispherical analyzer. The organic semiconductor tin phthalocyanine (SnPc) exhibits a Stranski-Krastanov growth mode on a polycrystalline gold substrate where the transition thickness between layered and clustered growth has been determined to be comparable to the thickness of a single molecular layer within which the molecules are standing on edge relative to the substrate plane.
Original languageEnglish
Title of host publicationMRS Proceedings
Pages mrsf10-1318-uu09-05
Publication statusPublished - 01 Jan 2011


  • photoemission
  • semiconducting
  • thin film


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