Abstract
The Schottky barrier of Na deposited onto ultrahigh vacuum cleaved p-type GaP has been determined by in situ current-voltage measurements. The Schottky barrier height of 1.10 eV for this low work function metal contacts is consistent with a general weak metal dependence for barrier formation on GaP(110).
| Original language | English |
|---|---|
| Pages (from-to) | 4486-4487 |
| Number of pages | 2 |
| Journal | Journal of Applied Physics |
| Volume | 72 |
| Issue number | 9 |
| DOIs | |
| Publication status | Published - 1992 |