@inproceedings{7ec3a649a28843dd88b88efeaebe7cb9,
title = "Detector array system on a single silicon chip - uniformity correction",
abstract = "An account is given on the work done using a detector array integrated on a single silicon chip. Focus is on array uniformity and the accurate measure of incident intensities. Two approaches to correction are also presented: spectra built up by measurement of single events can yield accurate peak intensities and positions; and where spectra are measured in the normal way by summing many events before readout, a correction for non-uniformity is desirable.",
author = "Keith Birkinshaw and Narayan, {Dinesh J.} and Langstaff, {David P.} and Greaves, {G. Neville}",
note = "Copyright: Copyright 2004 Elsevier Science B.V., Amsterdam. All rights reserved.; Proceedings of the 1999 Detectors for Crystallography and Diffraction Studies at Synchrotron Sources ; Conference date: 19-07-1999 Through 19-07-1999",
year = "1999",
language = "English",
volume = "3774",
series = "Proceedings of SPIE - The International Society for Optical Engineering",
publisher = "SPIE",
pages = "58--65",
booktitle = "Proceedings of the 1999 Detectors for Crystallography and Diffraction Studies at Synchrotron Sources",
}