Detector array system on a single silicon chip - uniformity correction

Keith Birkinshaw*, Dinesh J. Narayan, David P. Langstaff, G. Neville Greaves

*Corresponding author for this work

Research output: Chapter in Book/Report/Conference proceedingConference Proceeding (Non-Journal item)

2 Citations (SciVal)

Abstract

An account is given on the work done using a detector array integrated on a single silicon chip. Focus is on array uniformity and the accurate measure of incident intensities. Two approaches to correction are also presented: spectra built up by measurement of single events can yield accurate peak intensities and positions; and where spectra are measured in the normal way by summing many events before readout, a correction for non-uniformity is desirable.

Original languageEnglish
Title of host publicationProceedings of the 1999 Detectors for Crystallography and Diffraction Studies at Synchrotron Sources
Pages58-65
Number of pages8
Volume3774
Publication statusPublished - 1999
EventProceedings of the 1999 Detectors for Crystallography and Diffraction Studies at Synchrotron Sources - Denver, CO, USA
Duration: 19 Jul 199919 Jul 1999

Publication series

NameProceedings of SPIE - The International Society for Optical Engineering
PublisherSPIE
ISSN (Print)0277-786X

Conference

ConferenceProceedings of the 1999 Detectors for Crystallography and Diffraction Studies at Synchrotron Sources
CityDenver, CO, USA
Period19 Jul 199919 Jul 1999

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