Detector array system on a single silicon chip - uniformity correction

Keith Birkinshaw; Dinesh J. Narayan; David P. Langstaff; G. Neville Greaves

Detector array system on a single silicon chip - uniformity correction

Keith Birkinshaw^*
, Dinesh J. Narayan
, David P. Langstaff
, G. Neville Greaves

^*Corresponding author for this work

Department of Physics

Prifysgol Aberystwyth | Aberystwyth University

Research output: Chapter in Book/Report/Conference proceeding › Conference Proceeding (ISBN)

2 Citations (Scopus)

Abstract

An account is given on the work done using a detector array integrated on a single silicon chip. Focus is on array uniformity and the accurate measure of incident intensities. Two approaches to correction are also presented: spectra built up by measurement of single events can yield accurate peak intensities and positions; and where spectra are measured in the normal way by summing many events before readout, a correction for non-uniformity is desirable.

Original language	English
Title of host publication	Proceedings of the 1999 Detectors for Crystallography and Diffraction Studies at Synchrotron Sources
Pages	58-65
Number of pages	8
Volume	3774
Publication status	Published - 1999
Event	Proceedings of the 1999 Detectors for Crystallography and Diffraction Studies at Synchrotron Sources - Denver, CO, USA Duration: 19 Jul 1999 → 19 Jul 1999

Publication series

Name	Proceedings of SPIE - The International Society for Optical Engineering
Publisher	SPIE
ISSN (Print)	0277-786X

Conference

Conference	Proceedings of the 1999 Detectors for Crystallography and Diffraction Studies at Synchrotron Sources
City	Denver, CO, USA
Period	19 Jul 1999 → 19 Jul 1999

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@inproceedings{7ec3a649a28843dd88b88efeaebe7cb9,

title = "Detector array system on a single silicon chip - uniformity correction",

abstract = "An account is given on the work done using a detector array integrated on a single silicon chip. Focus is on array uniformity and the accurate measure of incident intensities. Two approaches to correction are also presented: spectra built up by measurement of single events can yield accurate peak intensities and positions; and where spectra are measured in the normal way by summing many events before readout, a correction for non-uniformity is desirable.",

author = "Keith Birkinshaw and Narayan, \{Dinesh J.\} and Langstaff, \{David P.\} and Greaves, \{G. Neville\}",

note = "Copyright: Copyright 2004 Elsevier Science B.V., Amsterdam. All rights reserved.; Proceedings of the 1999 Detectors for Crystallography and Diffraction Studies at Synchrotron Sources ; Conference date: 19-07-1999 Through 19-07-1999",

year = "1999",

language = "English",

volume = "3774",

series = "Proceedings of SPIE - The International Society for Optical Engineering",

publisher = "SPIE",

pages = "58--65",

booktitle = "Proceedings of the 1999 Detectors for Crystallography and Diffraction Studies at Synchrotron Sources",

}

Birkinshaw, K, Narayan, DJ, Langstaff, DP & Greaves, GN 1999, Detector array system on a single silicon chip - uniformity correction. in Proceedings of the 1999 Detectors for Crystallography and Diffraction Studies at Synchrotron Sources. vol. 3774, Proceedings of SPIE - The International Society for Optical Engineering, pp. 58-65, Proceedings of the 1999 Detectors for Crystallography and Diffraction Studies at Synchrotron Sources, Denver, CO, USA, 19 Jul 1999.

Detector array system on a single silicon chip - uniformity correction. / Birkinshaw, Keith; Narayan, Dinesh J.; Langstaff, David P. et al.
Proceedings of the 1999 Detectors for Crystallography and Diffraction Studies at Synchrotron Sources. Vol. 3774 1999. p. 58-65 (Proceedings of SPIE - The International Society for Optical Engineering).

Research output: Chapter in Book/Report/Conference proceeding › Conference Proceeding (ISBN)

TY - GEN

T1 - Detector array system on a single silicon chip - uniformity correction

AU - Birkinshaw, Keith

AU - Narayan, Dinesh J.

AU - Langstaff, David P.

AU - Greaves, G. Neville

PY - 1999

Y1 - 1999

N2 - An account is given on the work done using a detector array integrated on a single silicon chip. Focus is on array uniformity and the accurate measure of incident intensities. Two approaches to correction are also presented: spectra built up by measurement of single events can yield accurate peak intensities and positions; and where spectra are measured in the normal way by summing many events before readout, a correction for non-uniformity is desirable.

AB - An account is given on the work done using a detector array integrated on a single silicon chip. Focus is on array uniformity and the accurate measure of incident intensities. Two approaches to correction are also presented: spectra built up by measurement of single events can yield accurate peak intensities and positions; and where spectra are measured in the normal way by summing many events before readout, a correction for non-uniformity is desirable.

UR - https://www.scopus.com/pages/publications/0033309127

M3 - Conference Proceeding (ISBN)

AN - SCOPUS:0033309127

VL - 3774

T3 - Proceedings of SPIE - The International Society for Optical Engineering

SP - 58

EP - 65

BT - Proceedings of the 1999 Detectors for Crystallography and Diffraction Studies at Synchrotron Sources

T2 - Proceedings of the 1999 Detectors for Crystallography and Diffraction Studies at Synchrotron Sources

Y2 - 19 July 1999 through 19 July 1999

ER -

Detector array system on a single silicon chip - uniformity correction

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