@inproceedings{93e9f251801c457687bcdf3d5b6c3774,
title = "Huang diffuse scattering from small planar dislocation loops",
abstract = "This paper gives out a theoretical framework of electron/X-ray Huang diffuse scattering intensity at the immediate vicinity of Bragg reflection in reciprocal space. Nodal lines of two types in the simulated patterns of Huang diffuse scattering intensity are discussed in connection with a loop shape factor and the Huang diffuse scattering intensity from infinitesimal loops. It is suggested that the Huang diffuse scattering method is supplementary to the conventional TEM amplitude contrast imaging techniques and it has advantages in characterizing the morphology of very small dislocation loop when other methods fail.",
keywords = "Diffuse scattering, Dislocation loops, Huang diffuse scattering, Kinematical theory",
author = "Zhongfu Zhou and Yaru Zhang and Sutton, {Adrian P.} and Dudarev, {Sergei L.} and Jenkins, {Michael L.} and Kirk, {Mark A.} and Greaves, {George N.} and Lixin Xiao",
year = "2013",
doi = "10.1007/978-1-4471-4790-9_24",
language = "English",
isbn = "9781447147893",
series = "Lecture Notes in Electrical Engineering",
pages = "179--185",
booktitle = "Informatics and Management Science III",
note = "International Conference on Informatics and Management Science, IMS 2012 ; Conference date: 21-12-2012 Through 23-12-2012",
}