Huang diffuse scattering from small planar dislocation loops

Zhongfu Zhou*, Yaru Zhang, Adrian P. Sutton, Sergei L. Dudarev, Michael L. Jenkins, Mark A. Kirk, George N. Greaves, Lixin Xiao

*Corresponding author for this work

Research output: Chapter in Book/Report/Conference proceedingConference Proceeding (Non-Journal item)


This paper gives out a theoretical framework of electron/X-ray Huang diffuse scattering intensity at the immediate vicinity of Bragg reflection in reciprocal space. Nodal lines of two types in the simulated patterns of Huang diffuse scattering intensity are discussed in connection with a loop shape factor and the Huang diffuse scattering intensity from infinitesimal loops. It is suggested that the Huang diffuse scattering method is supplementary to the conventional TEM amplitude contrast imaging techniques and it has advantages in characterizing the morphology of very small dislocation loop when other methods fail.

Original languageEnglish
Title of host publicationInformatics and Management Science III
Number of pages7
Publication statusPublished - 2013
EventInternational Conference on Informatics and Management Science, IMS 2012 - Kunming, China
Duration: 21 Dec 201223 Dec 2012

Publication series

NameLecture Notes in Electrical Engineering
Volume206 LNEE
ISSN (Print)1876-1100
ISSN (Electronic)1876-1119


ConferenceInternational Conference on Informatics and Management Science, IMS 2012
Period21 Dec 201223 Dec 2012


  • Diffuse scattering
  • Dislocation loops
  • Huang diffuse scattering
  • Kinematical theory


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