Identifying chemical and physical changes in wide-gap semiconductors using real-time and near ambient-pressure XPS

Simon Astley, Di Hu, Kerry Hazeldine, Johnathan Ash, Rachel E. Cross, Simon Phillip Cooil, Martin W. Allen, James Evans, Kelvin James, Federica Venturini, David C. Grinter, Pilar Ferrer, Rosa Arrigo, Georg Held, Gruffudd Trefor Williams, D. Andrew Evans

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