In-situ monitoring of the growth of copper phthalocyanine films on InSb by organic molecular beam deposition

D. A. Evans; H. J. Steiner; R. Middleton; T. S. Jones; C. H. Chen; K. Horn; S. Park; T. U. Kampen; D. Tenne; D. R.T. Zahn; A. Patchett; I. T. McGovern

doi:10.1016/S0169-4332(01)00073-3

In-situ monitoring of the growth of copper phthalocyanine films on InSb by organic molecular beam deposition

D. A. Evans^*, H. J. Steiner, R. Middleton, T. S. Jones, C. H. Chen, K. Horn, S. Park, T. U. Kampen, D. Tenne, D. R.T. Zahn, A. Patchett, I. T. McGovern

^*Corresponding author for this work

Department of Physics

Research output: Contribution to journal › Article › peer-review

21 Citations (Scopus)

Abstract

Thin films of the organic semiconductor copper phthalocyanine (CuPc) have been grown on the InSb(1 1 1)A 2 × 2 surface by organic molecular beam deposition (OMBD). Soft X-ray photoelectron spectroscopy (SXPS) using synchrotron radiation, low energy electron diffraction (LEED) and Raman spectroscopy have been applied to monitor the bonding and energy band line-up at the CuPc-InSb interface. LEED shows that the first layer of CuPc is ordered. SXPS data reveal that the chemical interaction between the overlayer and the substrate is limited. The lineshapes of the shallow In and Sb core levels change very little during the growth of the CuPc film. Emission from the valence states of both InSb and CuPc was also monitored and the valence band offset for this hybrid system was determined to be (0.75 ± 0.14) eV. Raman spectroscopy confirms the limited interaction at the junction and further reveals that the structure of the CuPc film changes with increasing thickness.

Original language	English
Pages (from-to)	374-378
Number of pages	5
Journal	Applied Surface Science
Volume	175-176
DOIs	https://doi.org/10.1016/S0169-4332(01)00073-3
Publication status	Published - 15 May 2001

Keywords

Interface
Phthalocyanine
Spectroscopy

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Evans, D. A., Steiner, H. J., Middleton, R., Jones, T. S., Chen, C. H., Horn, K., Park, S., Kampen, T. U., Tenne, D., Zahn, D. R. T., Patchett, A., & McGovern, I. T. (2001). In-situ monitoring of the growth of copper phthalocyanine films on InSb by organic molecular beam deposition. Applied Surface Science, 175-176, 374-378. https://doi.org/10.1016/S0169-4332(01)00073-3

@article{e284ddc66f414cc799c9a585dfe9d86a,

title = "In-situ monitoring of the growth of copper phthalocyanine films on InSb by organic molecular beam deposition",

abstract = "Thin films of the organic semiconductor copper phthalocyanine (CuPc) have been grown on the InSb(1 1 1)A 2 × 2 surface by organic molecular beam deposition (OMBD). Soft X-ray photoelectron spectroscopy (SXPS) using synchrotron radiation, low energy electron diffraction (LEED) and Raman spectroscopy have been applied to monitor the bonding and energy band line-up at the CuPc-InSb interface. LEED shows that the first layer of CuPc is ordered. SXPS data reveal that the chemical interaction between the overlayer and the substrate is limited. The lineshapes of the shallow In and Sb core levels change very little during the growth of the CuPc film. Emission from the valence states of both InSb and CuPc was also monitored and the valence band offset for this hybrid system was determined to be (0.75 ± 0.14) eV. Raman spectroscopy confirms the limited interaction at the junction and further reveals that the structure of the CuPc film changes with increasing thickness.",

keywords = "Interface, Phthalocyanine, Spectroscopy",

author = "Evans, {D. A.} and Steiner, {H. J.} and R. Middleton and Jones, {T. S.} and Chen, {C. H.} and K. Horn and S. Park and Kampen, {T. U.} and D. Tenne and Zahn, {D. R.T.} and A. Patchett and McGovern, {I. T.}",

note = "Funding Information: The authors would like to thank the BESSY staff for their ready assistance and A.A. Cafolla for access to the core level data analysis software. This work was supported by the EU-LSI programme and the EPSRC (GR/M67414), and was performed within the EU DIODE network (HPRN-CT-1999-00164). Copyright: Copyright 2019 Elsevier B.V., All rights reserved.",

year = "2001",

month = may,

day = "15",

doi = "10.1016/S0169-4332(01)00073-3",

language = "English",

volume = "175-176",

pages = "374--378",

journal = "Applied Surface Science",

issn = "0169-4332",

publisher = "Elsevier",

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TY - JOUR

T1 - In-situ monitoring of the growth of copper phthalocyanine films on InSb by organic molecular beam deposition

AU - Evans, D. A.

AU - Steiner, H. J.

AU - Middleton, R.

AU - Jones, T. S.

AU - Chen, C. H.

AU - Horn, K.

AU - Park, S.

AU - Kampen, T. U.

AU - Tenne, D.

AU - Zahn, D. R.T.

AU - Patchett, A.

AU - McGovern, I. T.

N1 - Funding Information: The authors would like to thank the BESSY staff for their ready assistance and A.A. Cafolla for access to the core level data analysis software. This work was supported by the EU-LSI programme and the EPSRC (GR/M67414), and was performed within the EU DIODE network (HPRN-CT-1999-00164). Copyright: Copyright 2019 Elsevier B.V., All rights reserved.

PY - 2001/5/15

Y1 - 2001/5/15

N2 - Thin films of the organic semiconductor copper phthalocyanine (CuPc) have been grown on the InSb(1 1 1)A 2 × 2 surface by organic molecular beam deposition (OMBD). Soft X-ray photoelectron spectroscopy (SXPS) using synchrotron radiation, low energy electron diffraction (LEED) and Raman spectroscopy have been applied to monitor the bonding and energy band line-up at the CuPc-InSb interface. LEED shows that the first layer of CuPc is ordered. SXPS data reveal that the chemical interaction between the overlayer and the substrate is limited. The lineshapes of the shallow In and Sb core levels change very little during the growth of the CuPc film. Emission from the valence states of both InSb and CuPc was also monitored and the valence band offset for this hybrid system was determined to be (0.75 ± 0.14) eV. Raman spectroscopy confirms the limited interaction at the junction and further reveals that the structure of the CuPc film changes with increasing thickness.

AB - Thin films of the organic semiconductor copper phthalocyanine (CuPc) have been grown on the InSb(1 1 1)A 2 × 2 surface by organic molecular beam deposition (OMBD). Soft X-ray photoelectron spectroscopy (SXPS) using synchrotron radiation, low energy electron diffraction (LEED) and Raman spectroscopy have been applied to monitor the bonding and energy band line-up at the CuPc-InSb interface. LEED shows that the first layer of CuPc is ordered. SXPS data reveal that the chemical interaction between the overlayer and the substrate is limited. The lineshapes of the shallow In and Sb core levels change very little during the growth of the CuPc film. Emission from the valence states of both InSb and CuPc was also monitored and the valence band offset for this hybrid system was determined to be (0.75 ± 0.14) eV. Raman spectroscopy confirms the limited interaction at the junction and further reveals that the structure of the CuPc film changes with increasing thickness.

KW - Interface

KW - Phthalocyanine

KW - Spectroscopy

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U2 - 10.1016/S0169-4332(01)00073-3

DO - 10.1016/S0169-4332(01)00073-3

M3 - Article

AN - SCOPUS:0035873336

SN - 0169-4332

VL - 175-176

SP - 374

EP - 378

JO - Applied Surface Science

JF - Applied Surface Science

ER -

In-situ monitoring of the growth of copper phthalocyanine films on InSb by organic molecular beam deposition

Abstract

Keywords

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