Internal structure of copper(II)-phthalocyanine thin films on SiO2/Si substrates investigated by grazing incidence x-ray reflectometry

Abel Brieva, Tudor Jenkins, Daniel Garfield Jones, F. Strössner, D. A. Evans, G. F. Clark

Research output: Contribution to journalArticlepeer-review

5 Citations (SciVal)

Abstract

The internal structure of copper(II)-phthalocyanine (CuPc) thin films grown on SiO2/Si by organic molecular beam deposition has been studied by grazing incidence x-ray reflectometry (GIXR) and atomic force microscopy. The electronic density profile is consistent with a structure formed by successive monolayers of molecules in the form with the b axis lying in the substrate surface plane. The authors present an electronic density profile model of CuPc films grown on SiO2/Si. The excellent agreement between the model and experimental data allows postdeposition monitoring of the internal structure of the CuPc films with the nondestructive GIXR technique, providing a tool for accurate control of CuPc growth on silicon-based substrates. In addition, since the experiments have been carried out ex situ, they show that these structures can endure ambient conditions.
Original languageEnglish
Pages (from-to)73504
Number of pages73504
JournalJournal of Applied Physics
Volume99
Issue number7
DOIs
Publication statusPublished - Apr 2006

Fingerprint

Dive into the research topics of 'Internal structure of copper(II)-phthalocyanine thin films on SiO2/Si substrates investigated by grazing incidence x-ray reflectometry'. Together they form a unique fingerprint.

Cite this