Molecular organization in organic semiconductor thin films observed in real time

D. A. Evans*, O. R. Roberts, Alex Raymond Vearey-Roberts, G. T. Williams, Abel Brieva, D. P. Langstaff

*Corresponding author for this work

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Abstract

Post-deposition molecular rearrangement in thin organic films is revealed by in situ real-time photoelectron spectroscopy during organic molecular beam deposition. Agreement between real time spectroscopy and Monte Carlo modeling confirms the role of nearest-neighbor molecular attraction in driving a time-dependent morphology for oriented films of tin phthalocyanine (SnPc) on a range of substrates. The time-dependent molecular self-organization occurs over timescales comparable to the growth rates and is therefore an important factor in the degradation of thin films of organic semiconductors typically considered for the fabrication of multilayer semiconductor devices. (C) 2013 American Institute of Physics. [http://dx.doi.org/10.1063/1.4775762]

Original languageEnglish
Article number021605
Number of pages5
JournalApplied Physics Letters
Volume102
Issue number2
DOIs
Publication statusPublished - 14 Jan 2013

Keywords

  • LEVEL PHOTOELECTRON-SPECTROSCOPY
  • SURFACE
  • ENERGY ELECTRON-DIFFRACTION
  • GAAS(001)
  • GROWTH
  • MONOLAYERS
  • POSITION

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