Molecular organization in organic semiconductor thin films observed in real time

D. A. Evans; O. R. Roberts; Alex Raymond Vearey-Roberts; G. T. Williams; Abel Brieva; D. P. Langstaff

doi:10.1063/1.4775762

Molecular organization in organic semiconductor thin films observed in real time

D. A. Evans^*, O. R. Roberts, Alex Raymond Vearey-Roberts, G. T. Williams, Abel Brieva, D. P. Langstaff

^*Corresponding author for this work

Department of Physics

Research output: Contribution to journal › Article › peer-review

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Abstract

Post-deposition molecular rearrangement in thin organic films is revealed by in situ real-time photoelectron spectroscopy during organic molecular beam deposition. Agreement between real time spectroscopy and Monte Carlo modeling confirms the role of nearest-neighbor molecular attraction in driving a time-dependent morphology for oriented films of tin phthalocyanine (SnPc) on a range of substrates. The time-dependent molecular self-organization occurs over timescales comparable to the growth rates and is therefore an important factor in the degradation of thin films of organic semiconductors typically considered for the fabrication of multilayer semiconductor devices. (C) 2013 American Institute of Physics. [http://dx.doi.org/10.1063/1.4775762]

Original language	English
Article number	021605
Number of pages	5
Journal	Applied Physics Letters
Volume	102
Issue number	2
DOIs	https://doi.org/10.1063/1.4775762
Publication status	Published - 14 Jan 2013

Keywords

LEVEL PHOTOELECTRON-SPECTROSCOPY
SURFACE
ENERGY ELECTRON-DIFFRACTION
GAAS(001)
GROWTH
MONOLAYERS
POSITION

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title = "Molecular organization in organic semiconductor thin films observed in real time",

abstract = "Post-deposition molecular rearrangement in thin organic films is revealed by in situ real-time photoelectron spectroscopy during organic molecular beam deposition. Agreement between real time spectroscopy and Monte Carlo modeling confirms the role of nearest-neighbor molecular attraction in driving a time-dependent morphology for oriented films of tin phthalocyanine (SnPc) on a range of substrates. The time-dependent molecular self-organization occurs over timescales comparable to the growth rates and is therefore an important factor in the degradation of thin films of organic semiconductors typically considered for the fabrication of multilayer semiconductor devices. (C) 2013 American Institute of Physics. [http://dx.doi.org/10.1063/1.4775762]",

keywords = "LEVEL PHOTOELECTRON-SPECTROSCOPY, SURFACE, ENERGY ELECTRON-DIFFRACTION, GAAS(001), GROWTH, MONOLAYERS, POSITION",

author = "Evans, {D. A.} and Roberts, {O. R.} and Vearey-Roberts, {Alex Raymond} and Williams, {G. T.} and Abel Brieva and Langstaff, {D. P.}",

year = "2013",

month = jan,

day = "14",

doi = "10.1063/1.4775762",

language = "English",

volume = "102",

journal = "Applied Physics Letters",

issn = "0003-6951",

publisher = "American Institute of Physics",

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TY - JOUR

T1 - Molecular organization in organic semiconductor thin films observed in real time

AU - Evans, D. A.

AU - Roberts, O. R.

AU - Vearey-Roberts, Alex Raymond

AU - Williams, G. T.

AU - Brieva, Abel

AU - Langstaff, D. P.

PY - 2013/1/14

Y1 - 2013/1/14

N2 - Post-deposition molecular rearrangement in thin organic films is revealed by in situ real-time photoelectron spectroscopy during organic molecular beam deposition. Agreement between real time spectroscopy and Monte Carlo modeling confirms the role of nearest-neighbor molecular attraction in driving a time-dependent morphology for oriented films of tin phthalocyanine (SnPc) on a range of substrates. The time-dependent molecular self-organization occurs over timescales comparable to the growth rates and is therefore an important factor in the degradation of thin films of organic semiconductors typically considered for the fabrication of multilayer semiconductor devices. (C) 2013 American Institute of Physics. [http://dx.doi.org/10.1063/1.4775762]

AB - Post-deposition molecular rearrangement in thin organic films is revealed by in situ real-time photoelectron spectroscopy during organic molecular beam deposition. Agreement between real time spectroscopy and Monte Carlo modeling confirms the role of nearest-neighbor molecular attraction in driving a time-dependent morphology for oriented films of tin phthalocyanine (SnPc) on a range of substrates. The time-dependent molecular self-organization occurs over timescales comparable to the growth rates and is therefore an important factor in the degradation of thin films of organic semiconductors typically considered for the fabrication of multilayer semiconductor devices. (C) 2013 American Institute of Physics. [http://dx.doi.org/10.1063/1.4775762]

KW - LEVEL PHOTOELECTRON-SPECTROSCOPY

KW - SURFACE

KW - ENERGY ELECTRON-DIFFRACTION

KW - GAAS(001)

KW - GROWTH

KW - MONOLAYERS

KW - POSITION

UR - http://hdl.handle.net/2160/8247

U2 - 10.1063/1.4775762

DO - 10.1063/1.4775762

M3 - Article

SN - 0003-6951

VL - 102

JO - Applied Physics Letters

JF - Applied Physics Letters

IS - 2

M1 - 021605

ER -

Molecular organization in organic semiconductor thin films observed in real time

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Keywords

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