The design and use of a novel portable synchrotron end-station is described, that allows for the micro-imaging of X-ray absorption features of solids, via their luminescence emission. This mode of measurement is possible on most standard synchrotron beamlines (i.e. not only those with dedicated optics to allow X-ray micro-imaging) and any excitation energy is usable, typically from the UV to hard X-rays, 4 eV to 70 keV. Furthermore, since the micro-imaging is obtained via optical detection of X-ray absorption, a direct link between the X-ray features and the luminescence characteristics of a sample is possible. The article describes both the technical aspects of the new instrument and some of its early uses in the XUV energy range on beamline MPW 6.1 (40–450 eV) at the UK’s synchrotron radiation source at Daresbury.
|Number of pages
|Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms
|Early online date
|17 Feb 2006
|Published - 01 May 2006