Spectroscopic Ellipsometry and Optical Modelling of Structurally Colored Opaline Thin-Films

Chris E. Finlayson*, Giselle Rosetta, John J. Tomes

*Corresponding author for this work

Research output: Contribution to journalArticlepeer-review

3 Citations (SciVal)
58 Downloads (Pure)

Abstract

The method of spectroscopic ellipsometry is applied to complex periodic nanomaterials, consisting of shear-ordered polymeric nanosphere composites, with intense resonant structural color. A corresponding multilayer optical quasi-model of the system, parametrizing the inherent degree of sample disorder and encompassing key properties of effective refractive-index and index-contrast, is developed to elucidate the correlation between the ∆ and Ψ ellipsometric parameters and the shear-induced opaline crystallinity. These approaches offer reliable means of in-line tracking of the sample quality of such “polymer opals” in large scale processing and applications.
Original languageEnglish
Article number4888
Number of pages9
JournalApplied Sciences
Volume12
Issue number10
DOIs
Publication statusPublished - 12 May 2022

Keywords

  • ellipsometry
  • structural color
  • opal
  • polymers
  • optical modelling

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