Spectroscopic Ellipsometry and Optical Modelling of Structurally Colored Opaline Thin-Films

Chris E. Finlayson; Giselle Rosetta; John J. Tomes

doi:10.3390/app12104888

Spectroscopic Ellipsometry and Optical Modelling of Structurally Colored Opaline Thin-Films

Chris E. Finlayson^*, Giselle Rosetta, John J. Tomes

^*Corresponding author for this work

Department of Physics

Research output: Contribution to journal › Article › peer-review

5 Citations (Scopus)

78 Downloads (Pure)

Abstract

The method of spectroscopic ellipsometry is applied to complex periodic nanomaterials, consisting of shear-ordered polymeric nanosphere composites, with intense resonant structural color. A corresponding multilayer optical quasi-model of the system, parametrizing the inherent degree of sample disorder and encompassing key properties of effective refractive-index and index-contrast, is developed to elucidate the correlation between the ∆ and Ψ ellipsometric parameters and the shear-induced opaline crystallinity. These approaches offer reliable means of in-line tracking of the sample quality of such “polymer opals” in large scale processing and applications.

Original language	English
Article number	4888
Number of pages	9
Journal	Applied Sciences
Volume	12
Issue number	10
DOIs	https://doi.org/10.3390/app12104888
Publication status	Published - 12 May 2022

Keywords

ellipsometry
structural color
opal
polymers
optical modelling

Access to Document

10.3390/app12104888Licence: CC BY

ArticleFinal published version, 1.58 MBLicence: CC BY

Permanent link

Persistent link

Cite this

@article{6bb2d24adc1846d8925bdf58ef9d3817,

title = "Spectroscopic Ellipsometry and Optical Modelling of Structurally Colored Opaline Thin-Films",

abstract = "The method of spectroscopic ellipsometry is applied to complex periodic nanomaterials, consisting of shear-ordered polymeric nanosphere composites, with intense resonant structural color. A corresponding multilayer optical quasi-model of the system, parametrizing the inherent degree of sample disorder and encompassing key properties of effective refractive-index and index-contrast, is developed to elucidate the correlation between the ∆ and Ψ ellipsometric parameters and the shear-induced opaline crystallinity. These approaches offer reliable means of in-line tracking of the sample quality of such “polymer opals” in large scale processing and applications.",

keywords = "ellipsometry, structural color, opal, polymers, optical modelling",

author = "Finlayson, {Chris E.} and Giselle Rosetta and Tomes, {John J.}",

note = "Funding Information: Funding: This research was funded in part by Llywodraeth Cymru KESS-2 (European Social Fund), SPARC-II (European Regional Development Fund). Publisher Copyright: {\textcopyright} 2022 by the authors. Licensee MDPI, Basel, Switzerland.",

year = "2022",

month = may,

day = "12",

doi = "10.3390/app12104888",

language = "English",

volume = "12",

journal = "Applied Sciences",

publisher = "Multidisciplinary Digital Publishing Institute",

number = "10",

}

TY - JOUR

T1 - Spectroscopic Ellipsometry and Optical Modelling of Structurally Colored Opaline Thin-Films

AU - Finlayson, Chris E.

AU - Rosetta, Giselle

AU - Tomes, John J.

N1 - Funding Information: Funding: This research was funded in part by Llywodraeth Cymru KESS-2 (European Social Fund), SPARC-II (European Regional Development Fund). Publisher Copyright: © 2022 by the authors. Licensee MDPI, Basel, Switzerland.

PY - 2022/5/12

Y1 - 2022/5/12

N2 - The method of spectroscopic ellipsometry is applied to complex periodic nanomaterials, consisting of shear-ordered polymeric nanosphere composites, with intense resonant structural color. A corresponding multilayer optical quasi-model of the system, parametrizing the inherent degree of sample disorder and encompassing key properties of effective refractive-index and index-contrast, is developed to elucidate the correlation between the ∆ and Ψ ellipsometric parameters and the shear-induced opaline crystallinity. These approaches offer reliable means of in-line tracking of the sample quality of such “polymer opals” in large scale processing and applications.

AB - The method of spectroscopic ellipsometry is applied to complex periodic nanomaterials, consisting of shear-ordered polymeric nanosphere composites, with intense resonant structural color. A corresponding multilayer optical quasi-model of the system, parametrizing the inherent degree of sample disorder and encompassing key properties of effective refractive-index and index-contrast, is developed to elucidate the correlation between the ∆ and Ψ ellipsometric parameters and the shear-induced opaline crystallinity. These approaches offer reliable means of in-line tracking of the sample quality of such “polymer opals” in large scale processing and applications.

KW - ellipsometry

KW - structural color

KW - opal

KW - polymers

KW - optical modelling

UR - http://www.scopus.com/inward/record.url?scp=85130541525&partnerID=8YFLogxK

U2 - 10.3390/app12104888

DO - 10.3390/app12104888

M3 - Article

VL - 12

JO - Applied Sciences

JF - Applied Sciences

IS - 10

M1 - 4888

ER -

Spectroscopic Ellipsometry and Optical Modelling of Structurally Colored Opaline Thin-Films

Abstract

Keywords

Access to Document

Permanent link

Other files and links

Fingerprint

Data to support "Spectroscopic Ellipsometry and Optical Modelling of Structurally Colored Opaline Thin-Films"

SPARC II - Solar Photovoltaic Academic Research

Cite this

Spectroscopic Ellipsometry and Optical Modelling of Structurally Colored Opaline Thin-Films

Abstract

Keywords

Access to Document

Permanent link

Other files and links

Fingerprint

Datasets

Data to support "Spectroscopic Ellipsometry and Optical Modelling of Structurally Colored Opaline Thin-Films"

Projects

SPARC II - Solar Photovoltaic Academic Research

Cite this