Spectroscopic Ellipsometry and Optical Modelling of Structurally Colored Opaline Thin-Films

Chris E. Finlayson*, Giselle Rosetta, John J. Tomes

*Corresponding author for this work

Research output: Contribution to journalArticlepeer-review

3 Citations (SciVal)
58 Downloads (Pure)


The method of spectroscopic ellipsometry is applied to complex periodic nanomaterials, consisting of shear-ordered polymeric nanosphere composites, with intense resonant structural color. A corresponding multilayer optical quasi-model of the system, parametrizing the inherent degree of sample disorder and encompassing key properties of effective refractive-index and index-contrast, is developed to elucidate the correlation between the ∆ and Ψ ellipsometric parameters and the shear-induced opaline crystallinity. These approaches offer reliable means of in-line tracking of the sample quality of such “polymer opals” in large scale processing and applications.
Original languageEnglish
Article number4888
Number of pages9
JournalApplied Sciences
Issue number10
Publication statusPublished - 12 May 2022


  • ellipsometry
  • structural color
  • opal
  • polymers
  • optical modelling


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