Synchrotron radiation studies of the growth and beam damage of tin-phthalocyanine on GaAs(0 0 1)-1 × 6 substrates

G. Cabailh, J.w. Wells, I. T. McGovern, Alex Raymond Vearey-Roberts, A. Bushell, D. Andrew Evans

Research output: Contribution to journalArticlepeer-review

19 Citations (Scopus)

Abstract

The tunability of synchrotron radiation is exploited to probe the structural properties of SnPc films deposited on a GaAs(0 0 1) surface. Soft X-ray photoelectron spectroscopy (SXPS) shows that the organic adlayer is weakly interacting with the surface and that the growth mode is Stranski–Krastanov. Near edge X-ray absorption fine structure (NEXAFS) shows that the plane of SnPc molecules in a thick adlayer is close to parallel with the substrate. High photon flux ‘beam damage’ is apparent in an increased binding energy of the Sn4d core level.
Original languageEnglish
Pages (from-to)144-148
Number of pages5
JournalApplied Surface Science
Volume234
Issue number1-4
Early online date24 Jun 2004
DOIs
Publication statusPublished - 15 Jul 2004

Keywords

  • Beam damage
  • GaAs
  • NEXAFS
  • Organic molecules
  • PES
  • Phthalocyanine
  • SXPS
  • SnPc

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