Abstract
The tunability of synchrotron radiation is exploited to probe the structural properties of SnPc films deposited on a GaAs(0 0 1) surface. Soft X-ray photoelectron spectroscopy (SXPS) shows that the organic adlayer is weakly interacting with the surface and that the growth mode is Stranski–Krastanov. Near edge X-ray absorption fine structure (NEXAFS) shows that the plane of SnPc molecules in a thick adlayer is close to parallel with the substrate. High photon flux ‘beam damage’ is apparent in an increased binding energy of the Sn4d core level.
| Original language | English |
|---|---|
| Pages (from-to) | 144-148 |
| Number of pages | 5 |
| Journal | Applied Surface Science |
| Volume | 234 |
| Issue number | 1-4 |
| Early online date | 24 Jun 2004 |
| DOIs | |
| Publication status | Published - 15 Jul 2004 |
Keywords
- Beam damage
- GaAs
- NEXAFS
- Organic molecules
- PES
- Phthalocyanine
- SXPS
- SnPc