TY - JOUR
T1 - The electrical properties of Na overlayers on the clean, cleaved GaAs(110) surface
AU - McLean, A. B.
AU - Evans, D. A.
AU - Williams, R. H.
N1 - Copyright:
Copyright 2007 Elsevier B.V., All rights reserved.
PY - 1987
Y1 - 1987
N2 - The electrical properties of moderately doped Na/n-GaAs(110) Schottky diodes, fabricated on the clean, cleaved GaAs(110) surface under ultra-high vacuum conditions, have been studied in situ. The Schottky barrier height extracted from the current-voltage characteristics of several diodes lies in the range 0.69-0.72 V. The barrier height obtained from the conventional capacitance-voltage technique (ignoring the image force correction of about 0.03 V) lies slightly higher (0.76-0.82 V). Moreover, the Ga and As 3d core-level emission, measured using synchrotron-radiation-excited soft-X-ray photo-emission spectroscopy, exhibit metal-induced shifts associated with semiconductor band bending. These measurements suggest that, like many other metals, Na pins the GaAs Fermi level close to mid-gap despite its extremely low work function and low electronegativity.
AB - The electrical properties of moderately doped Na/n-GaAs(110) Schottky diodes, fabricated on the clean, cleaved GaAs(110) surface under ultra-high vacuum conditions, have been studied in situ. The Schottky barrier height extracted from the current-voltage characteristics of several diodes lies in the range 0.69-0.72 V. The barrier height obtained from the conventional capacitance-voltage technique (ignoring the image force correction of about 0.03 V) lies slightly higher (0.76-0.82 V). Moreover, the Ga and As 3d core-level emission, measured using synchrotron-radiation-excited soft-X-ray photo-emission spectroscopy, exhibit metal-induced shifts associated with semiconductor band bending. These measurements suggest that, like many other metals, Na pins the GaAs Fermi level close to mid-gap despite its extremely low work function and low electronegativity.
UR - http://www.scopus.com/inward/record.url?scp=0023400476&partnerID=8YFLogxK
U2 - 10.1088/0268-1242/2/8/013
DO - 10.1088/0268-1242/2/8/013
M3 - Article
AN - SCOPUS:0023400476
SN - 0268-1242
VL - 2
SP - 547
EP - 549
JO - Semiconductor Science and Technology
JF - Semiconductor Science and Technology
IS - 8
M1 - 013
ER -