AbstractThis thesis covers the range of aberrations occurring when an electron counting imaging detector is placed at the focal plane of an electron energy analyser used for photoelectron spectroscopy.
The technique of photoelectron spectroscopy is introduced, showing how it may be used to characterise the surface layers of a sample. The nature of artefacts and aberrations observed in an electron energy analyser are discussed and consideration is given to different techniques and algorithms to correct a measured spectrum for these artefacts.
|Date of Award||21 May 2009|
|Sponsors||Engineering and Physical Sciences Research Council|
|Supervisor||Dave Langstaff (Supervisor) & Andrew Evans (Supervisor)|